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Silicon optical wafer performance system test scheme

Test plan for silicon wafer performance system

  • Silicon optical chip testing On Wafer
    Silicon optical chip testing On Wafer

    Silicon photonics technology uses the manufacturing process of integrated circuits and the advantages of high bandwidth optical communication technology to achieve high efficiency photoelectric conversion and signal processing at the wafer level. Everise's self-developed software synchronizes the precision probe station and the photoelectric test equipment to efficiently and accurately test the wavelength domain, direct basin, frequency domain and reliability of silicon optical chips. Test items include: IL/PDL, LIV, bias-control, Bandwidth, Phase, group delay and Return loss, etc.

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