Scanning electron microscopeDivided into desktop scanning electron microscopy, vertical scanning electron microscopy (tungsten filament), cold field scanning electron microscopy. Select according to magnification.

Silicon photonics technology uses the manufacturing process of integrated circuits and the advantages of high bandwidth optical communication technology to achieve high efficiency photoelectric conversion and signal processing at the wafer level. Everise's self-developed software synchronizes the precision probe station and the photoelectric test equipment to efficiently and accurately test the wavelength domain, direct basin, frequency domain and reliability of silicon optical chips. Test items include: IL/PDL, LIV, bias-control, Bandwidth, Phase, group delay and Return loss, etc.

Shanghai Hengfu Electronic Technology Co., Ltd. can provide customers with RF front-end test solutions based on Keysight and other manufacturers' integrated measuring instrument/signal source/spectrum analyzer/network analyzer and other equipment, including:

Shanghai Hengfu Electronic Technology Co., Ltd. has rich experience in the parameter testing of power semiconductor devices, not only based on Keysight's B150xA/B290xA and other equipment, to provide: