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Semiconductor RF front-end test system solution

Solution for semiconductor RF front-end testing sy

  • Wafer level CP test system
    Wafer level CP test system

    Shanghai Everise provides flexible configuration test solutions with industry-leading UPH, test accuracy and rich delivery experience to help customers deploy test systems quickly. The test system is mainly composed of vector network analyzer, probe station, PC software and related accessories (GPIB cable, RF cable, film probe card and calibration sheet, etc.). The system supports the mainstream vector network analyzer in the industry, and provides industry-leading test speed and accuracy with the help of self-developed PC software.

  • Design verification test DVT and package test system
    Design verification test DVT and package test system

    Shanghai Everise's solutions enable fast and comprehensive performance testing of power amplifier modules such as PAD devices, including S-parameter, demodulation, power, adjacent channel power and harmonic distortion measurements. N7614EMBC and N9055EM0E power amplifier test software based on Keysight makes it possible to generate and analyze digital predistortion (DPD) and envelope tracking signals. In addition, Beech's solution control software enables tight synchronization between the signal source and the arbitrary waveform generator (AWG) for optimal alignment between the input signal and the envelope.

  • Sorting test machine FT test system
    Sorting test machine FT test system

    Everise sorting and testing machine focus on chip FT testing, in the pursuit of faster speed, higher precision, but also adhering to the technology as support, customer-centric, to provide users with stable, reliable and efficient service policy. The all-in-one machine is mainly composed of vector network analyzer, Handler, upper computer software and related accessories. The system is mainly used in the back-end production of semiconductor chips, and can fully complete the appearance and size detection of chips, electrical parameter testing, laser printing mark, mark detection, classification, screening, storage and final braid packaging output and other functions of the integrated equipment. With self-developed PC software, it provides industry-leading test speed and accuracy.

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