Silicon photonics technology uses the manufacturing process of integrated circuits and the advantages of high bandwidth optical communication technology to achieve high efficiency photoelectric conversion and signal processing at the wafer level. Everise's self-developed software synchronizes the precision probe station and the photoelectric test equipment to efficiently and accurately test the wavelength domain, direct basin, frequency domain and reliability of silicon optical chips. Test items include: IL/PDL, LIV, bias-control, Bandwidth, Phase, group delay and Return loss, etc.

Accurate measurement of insertion loss (IL) and polarization dependent loss (PDL) is essential for the performance verification of passive optical devices. The solution integrates a laser source, polarization synthesizer, optical power meter, and photon application kit to enable efficient and accurate chip - and module-level IL/PDL testing using the Muller Matrix approach. Everise photon test software, graphical test process, can be one-click to generate customized Datasheet, maximize the simplification of the test process, to help passive optical device IL/PDL parameters production and research and development of testing.

Everise offers a comprehensive optical module test solution that integrates the industry-leading Keysight N1092X series sampling oscilloscope with the N107XX series Clock Recovery Instrument (CDR) and error meter to perform accurate tests up to 64 GBd PAM4.This scheme can choose multi-channel test optimization software, build multi-module parallel test environment, reduce the queuing time during the test process, reduce cost and increase efficiency.The system supports comprehensive signal integrity analysis, and supports 25G/28Gbps NRZ, 53G/56Gbps PAM4, 106G/112Gbps PAM4 optical signal testing. Provide 100G, 400G, 800G pressure tolerance test solutions. The test items include the noise margin, bit error rate, SER and TDECQ to ensure that the optical module meets all performance requirements of the IEEE 802.3 international communication standard.

For R D testing and 200Gbps and above optical module testing, Keysight DCA-X series sampling oscilloscope and its supporting modules are used to provide comprehensive, accurate and efficient test solutions. The solution includes Keysight AWG and M8000 series error meter, which supports the test from 250Mb/s to 224Gb/s PAM4, covering multiple test items such as optical and electrical, to ensure the test reliability and stability of various optical modules in various performance indicators.

The Keysight DCA-M series is based on Keysight's Digital Communication Analyzer (DCA) technology and is widely recognized as a benchmarking instrument to verify that optical transmitters meet communication standards. The DCA-M's compact form factor design offers a choice of optical and electrical channels from single to four channels for manufacturing and RD applications.

Scanning electron microscopeDivided into desktop scanning electron microscopy, vertical scanning electron microscopy (tungsten filament), cold field scanning electron microscopy. Select according to magnification.

Silicon photonics technology uses the manufacturing process of integrated circuits and the advantages of high bandwidth optical communication technology to achieve high efficiency photoelectric conversion and signal processing at the wafer level. Everise's self-developed software synchronizes the precision probe station and the photoelectric test equipment to efficiently and accurately test the wavelength domain, direct basin, frequency domain and reliability of silicon optical chips. Test items include: IL/PDL, LIV, bias-control, Bandwidth, Phase, group delay and Return loss, etc.

Shanghai Hengfu Electronic Technology Co., Ltd. can provide customers with RF front-end test solutions based on Keysight and other manufacturers' integrated measuring instrument/signal source/spectrum analyzer/network analyzer and other equipment, including:

Shanghai Hengfu Electronic Technology Co., Ltd. has rich experience in the parameter testing of power semiconductor devices, not only based on Keysight's B150xA/B290xA and other equipment, to provide:

Shanghai Hengfu Electronic Technology Co., Ltd. has deep accumulation and rich experience in high-speed chip testing, and can provide customers with complete TX/RX solutions based on Keysight oscilloscope, error meter and other equipment, including high-speed probe, high and low temperature box, high-speed fixture, EVB board, switching switch and so on. On the otherIn addition, for high-speed chip back testing requires a large number of repeated high and low temperature tests and key parameter extraction, Hengbuk Electronics can also provide a complete set of automated test software to help customers improve test efficiency.

Shanghai Hengfu Electronic Technology Co., Ltd. has rich experience in the component testing industry, especially in the millimeter band. Based on the Keysight network analyzer and other RF test instruments, Beech can provide a complete test solution for RF components such as FeMid(integrated switch, filter and diplexer) and PaMid(integrated multi-mode multi-band PA and FeMid) as well as AiP and mmwave front-end modules.