Accurate measurement of insertion loss (IL) and polarization dependent loss (PDL) is essential for the performance verification of passive optical devices. The solution integrates a laser source, polarization synthesizer, optical power meter, and photon application kit to enable efficient and accurate chip - and module-level IL/PDL testing using the Muller Matrix approach. Everise photon test software, graphical test process, can be one-click to generate customized Datasheet, maximize the simplification of the test process, to help passive optical device IL/PDL parameters production and research and development of testing.