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High speed digital chip automatic test system

High speed digital chip automation testing system

  • High speed digital chip automatic test system
    High speed digital chip automatic test system

    Shanghai Everise Electronic Technology Co., Ltd. has deep accumulation and rich experience in high-speed chip testing, and can provide customers with complete TX/RX solutions based on Keysight oscilloscope, error meter and other equipment, including high-speed probe, high and low temperature box, high-speed fixture, EVB board, switching switch and so on. In addition, for high-speed chip back testing requires a large number of repeated high and low temperature tests and key parameter extraction, Hengbuk Electronics can also provide a complete set of automated test software to help customers improve test efficiency.

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