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IL/PDL test solutions for passive optical devices

IL/PDL test solutions for passive optical devices

  • IL/PDL test solutions for passive optical devices

    Accurate measurement of insertion loss (IL) and polarization dependent loss (PDL) is essential for the performance verification of passive optical devices. The solution integrates a laser source, polarization synthesizer, optical power meter, and photon application kit to enable efficient and accurate chip - and module-level IL/PDL testing using the Muller Matrix approach. Everise photon test software, graphical test process, can be one-click to generate customized Datasheet, maximize the simplification of the test process, to help passive optical device IL/PDL parameters production and research and development of testing.

    Hotline

    400-800-3290
  • Features
  • Parameter
  • Test schema
  • · Fast polarization state switching: The polarization synthesizer is used to achieve fast polarization state switching, which can complete the measurement of various polarization states in a short time and improve the test efficiency. The output power and polarization state are recorded synchronously to ensure data synchronization and consistency during measurement.

    · Muller Matrix method: The international standard Muller matrix method (IEC 61300-3-2 and IEC 61300-3-29) is used to provide extremely high measurement accuracy and reliability.

    · Multi-channel test: Support multi-channel test, suitable for complex optical network components, such as multiplexers and switches, can simultaneously measure multiple ports, improve test efficiency.

    · Customized software: graphical test process, one-click generation of Datasheet, maximize the simplification of the test process. Improve production efficiency while ensuring accurate test results.

    · High dynamic range and high resolution: Supports high dynamic range and high resolution measurement, especially suitable for fine wavelength measurement of DWDM components.


    1. The output wavelength of 1240-1380 nm/ 1340-1495 nm/ 1450-1650 nm/1490-1640 nm covers the OESCL measurement band;

    2. Maximum wavelength scanning speed 200 nm/s;

    3. Maximum power of laser source: > +12 dBm; Absolute wavelength accuracy: ±1.5 pm; Signal to SSE ratio: ≥ 80 dB/nm;

    4. 6 kinds of SOP fast switching, as short as 10μS switching time; Provides stable output of 50μS;

    5. The minimum sampling time of optical power meter is 1μS.


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