The N7788C optical device analyzer combines polarization control and analysis functions for a variety of applications in the laboratory. In particular, the N7788C can be used with tunable laser sources to measure the effect of optical devices on signal polarization states (SOP). The measurement is based on generalized standard Jones Matrix Eigenanalysis (JME), using a unique single-scan polarization correlation method to determine parameters such as polarization mode dispersion (PMD), Difference group delay (DGD), and polarization dependent loss (PDL). This method makes the measurement more efficient and accurate.